This week we discuss infrared deflectometry and its applications towards large optics fabrication. By utilizing a long wavlength, surfaces that are not reflective in the visible are able to be tested using deflectometry. Some of the challenges that went into the IR deflectometry system, including source design, geometry considerations, and source errors are discussed. Additionally, Graves comments on his experience in being part of the team that performed metrology for the 4.2 m DKIST primary mirror.
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